Electromigration-Aware Memory Hierarchy Architecture

نویسندگان

چکیده

New mission-critical applications, such as autonomous vehicles and life-support systems, set a high bar for the reliability of modern microprocessors that operate in highly challenging conditions. However, while cutting-edge integrated circuit (IC) technologies have intensified by providing remarkable reductions silicon area power consumption, they also introduce new challenges through complex design rules impose, creating significant hurdle process. In this paper, we focus on electromigration (EM), which is crucial factor impacting IC reliability. EM refers to degradation process metal nets when used both supply interconnecting signals. Typically, concerns been addressed at backend, circuit, layout levels, where are enforced assuming extreme conditions identify resolve violations. This study presents techniques leverage architectural features mitigate effect memory hierarchy microprocessors. Architectural approaches can reduce complexity solving EM-related violations, complement enhance common existing methods. study, present comprehensive simulation analysis demonstrates how proposed solution significantly extend lifetime microprocessor’s with minimal overhead terms performance, power, relaxing efforts.

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ژورنال

عنوان ژورنال: Journal of Low Power Electronics and Applications

سال: 2023

ISSN: ['2079-9268']

DOI: https://doi.org/10.3390/jlpea13030044